Keysight-Agilent N4457A

The N4457A noise-parameter measurement system provides solid-state-tuner-based small-signal characterization of RF and microwave semiconductor devices. From high gain, sub-1-dB noise-figure transistors, to millimeter wave low-noise amplifiers, Agilent's noise-parameter measurement system can handle the most challenging assignments. The noise-parameter-measurement software controls the system hardware, including power supplies for DC bias, and wafer probe stations (not included with the system). Full test plans can be generated, and complex measurement sequences can be stored using the powerful built-in macro utility. Graphical and tabular report generation and data transfer to external electronic design automation (EDA) programs is fast and easy.