Keysight-Agilent 4155C

Semiconductor Parameter Analyzer The Agilent 4155C Semiconductor Parameter Analyzer is a cost-effective, accurate laboratory bench top solution for advanced device characterization. The low-current and low-voltage resolution and built-in quasi-static CV measurement capability of the 4155C provide a firm foundation for future expansion with other measurement instruments. The 41501B Expander extends your capabilities to 1A/200V, and add a low noise ground unit and dual pulse generators on the 4155C.

Options

• 020 Delete Windows Controller for Parametric Analysis & Chracterization
• 0KN Self paced training
• 200 1.5m interlock, 4x coaxial, 4x triaxial cables
• 230 3.0m interlock, 4x coaxial, 4x triaxial cables
• A6J ANSI Z540 compliant calibration
• ABA U.S. - English localization
• ABJ Japan - Japanese localization
• L25 Int opt I/CV 3.0 Parallel Security Key
• L26 Int opt I/CV 3.0 USB Security Key
• L27 Not 4155C-DIV 3.0
• L28 Not 4155C-DIV 3.0 (Japanese Localize)
• L90 Int opt 100V TEST
• L91 Int opt 120V TEST
• L92 Int opt 220V TEST
• L93 Int opt 240V TEST
• PAR Parallel Security Key
• RMKT Agilent Refurbished Product
• UK6 Commercial cal. certificate w/ test data
• USB USB Security Key

Keysight-Agilent 4155C datasheet & specifications