Hioki IM7580

Product Features
1. High-speed, 300 MHz high-frequency measurement
The IM7580 can perform measurement at frequencies ranging from 1 MHz to 300 MHz. Operating in LCR Mode, in which measurements are performed at a single frequency, the impedance analyzer can be used to generate PASS and FAIL results during shipping inspections. Operating in Analyzer Mode, in which the frequency is varied while performing measurement, the analyzer can be used to evaluate characteristics in product development and a variety of other applications.

2. Productivity gains from highly stable, high-speed measurement at speeds as fast as 0.5 ms
The IM7580 can perform high-speed measurement at speeds as fast as 0.5 ms (0.0005 sec.). For electronic component manufacturers that wish to test large volumes of parts more quickly, this speed advantage can yield a significantly boost to productivity.

In addition, measurement repeatability has been increased by a factor of 10 from the legacy Hioki model, enabling stable measurement, improving production yields, and boosting productivity.

3. Compact footprint for lower production costs
Electronic component manufacturers build automatic testing systems on their production lines by installing various types of devices in equipment racks. Smaller equipment means more compact testing systems, and the ability to mount multiple instruments in less space reduces testing times, lowering production costs.

Thanks to the instrument’s half-rack size (215 [W] x 200 [H] x 268 [D] mm), two IM7580 units can fit into a standard-width rack.

4. PASS/FAIL judgments based on a variety of judgment functions
LCR Mode, in which measurements are performed at a single frequency, provides comparator functionality for generating PASS/FAIL judgments for electronic components as well as bin functionality for sorting components. The comparator function allows customers to set upper and lower limits and then generates PASS/FAIL results based on those criteria. Where the comparator function generates judgments based on one set of criteria, the bin function allows users to set up to 10 sets of judgment criteria and then ranks parts accordingly.

Analyzer Mode, in which the frequency is varied while performing measurement, provides area and peak comparison functionality for generating PASS/FAIL judgments based on electronic components’ frequency characteristics. Area judgment allows users to verify that measured values fall within a previously configured judgment area, while peak judgment allows users to detect resonance points based on previously configured upper, lower, left, and right limits.