Tektronix 80E09 Details

Tektronix 80E09

Electrical Sampling Modules
80E10 80E09 80E08 80E07 80E06 80E06X2 80E04 80E03 80E01
Features & Benefits
All Modules

Up to 70 GHz Bandwidth and 5 ps Measured Rise Time (10 - 90%)

Lowest Noise for Analysis - 450 ?VRMS at 60 GHz, 300 ?VRMS at 30 GHz

Remote Samplers

1 Enable Location of Sampler Near DUT and Ensure Best Signal Fidelity

Independent Sampler Deskew Ensures Easy Fixture and Probe De-embedding

Dual Channel (Except 80E01 and 80E06)

Precision Microwave Connectors (3.5 mm, 2.92 mm, 2.4 mm and 1.85 mm)

Probe Support (Except 80E06)

TDR Modules

15 ps Reflected True Differential Fully Integrated TDR Rise Time (12 ps Incident) and Feature Resolution Below 1 mm

Efficient, Accurate, Easy to use, and Cost Effective S-parameters up to 50 GHz

Applications

Impedance Characterization and S-parameter Measurements for Serial Data Applications

Advanced Jitter, Noise and BER Analysis

Channel and Eye Diagram Simulation and Measurement-based Spice Modeling

80E10, 80E08, and 80E04

High-Performance TDR/T Measurements

Impedance Profile, Inductance, Capacitance and S-parameters

Transmission Line Quality, Impedance, and Crosstalk

True Differential, Common Mode, and Single Ended Measurements

Efficient Fault Isolation

80E09, 80E07, 80E06, 80E01

High-Frequency, Low-Noise Signal Acquisition

Fast Rise Time Measurements

Jitter Analysis and Waveform Analysis

80E03

Device Characterization, Transmission Quality, Waveform Parameters

Low Signal Measurements

1 Integrated on 80E07 - 80E10 and optional on 80E01 - 80E04 and 80E06.
TDR Modules: 80E10, 80E08, and 80E04

The 80E10, 80E08, and 80E04 are dual-channel Time Domain Reflectometry (TDR) sampling modules, providing up to 12 ps incident and 15 ps reflected rise time in the 80E10 (18 ps incident in 80E08 and 23 ps incident in 80E04). Each channel of these modules is capable of generating a fast step for use in TDR mode and the acquisition portion of the sampling module monitors the incident step and any reflected energy. The polarity of each channel s step can be selected independently. This allows for differential or common-mode TDR or S-parameters testing of two coupled lines, in addition to the independent testing of isolated lines. The independent step generation for each channel allows true differential measurements, which ensures measurement accuracy for differential devices.

The 80E10 and 80E08 are small form-factor, fully integrated independent 2 meter remote sampler systems, enabling location of the sampler near the DUT and ensuring the best signal fidelity. An optional 2 meter extender is available for 80E04. The modules characterize crosstalk by using TDR steps to drive one line (or line pair for differential crosstalk) while monitoring a second line (or line pair) with the other channel (or another module for differential crosstalk). The "filter" function on the 8200 and 8000 series mainframes can be used with TDR or crosstalk measurements to characterize expected system performance with slower edge rates.

All modules have independent incident step and receiver deskew to remove the effect of measurement fixtures and probes, that enable faster and easier de-embedding of test fixtures. The 80E10 sampling modules provide an acquisition rise time of 7 ps, with up to 50 GHz user-selectable equivalent bandwidth (with 50, 40, and 30 GHz settings). The 80E08 sampling bandwidth is 30 GHz (user-selectable with 30 and 20 GHz settings) and 80E04 sampling bandwidth is 20 GHz. The 20 GHz P8018 single ended and 18 GHz P80318 differential variable pitch TDR probes provide excellent performance and compliance, ensuring easy and accurate backplane and package measurements.

When the user employs these modules with Tektronix IConnect TDR and VNA software, he or she can acquire up to 1,000,000 data points and obtain up to 50 GHz differential, mixed mode and single ended S-parameters. IConnect also enables impedance, S-parameters, and eye diagram compliance testing as required by various serial data standards, as well as full channel analysis, Touchstone (SnP) file output and SPICE modeling for gigabit interconnects.
Sampling Modules: 80E09, 80E07, 80E06, 80E03, and 80E01

The 80E09 and 80E07 are dual-channel modules with remote samplers, capable of 450 ?VRMS noise at 60 GHz sampling bandwidth, and 300 ?V at 30 GHz sampling bandwidth. Each small form factor remote sampler is attached to a 2 meter cable in order to minimize the effects of cables, probes, and fixtures, allow close location of the sampler to the DUT, and ensure best signal fidelity. User-selectable bandwidth settings (60/40/30 on 80E09 and 30/20 on 80E07) offer optimal noise/bandwidth trade-off.

80E06 and 80E01 are single channel, 70+ and 50 GHz bandwidth sampling modules. 80E06 provides the widest measurement bandwidth and fastest rise time measurements with world-class signal fidelity. Both 80E06 and 80E01 provide superior maximum operating range of 1.6 V. Both of these modules can be used with the optional 2 meter extender cable, which ensures superior signal fidelity and measurement flexibility.

The 80E03 is a dual-channel, 20 GHz sampling module. This sampling module provides an acquisition rise time of 17.5 ps or less. An optional 2 meter extender cable is available.

When used with Tektronix 80SJNB Jitter, Noise, & BER software, these modules enable separation of both jitter and noise into their components, understand precise causes of eye closure, and obtain highly accurate extrapolation of BER and 3-D eye contour. When used with 82A04 phase reference module, timebase accuracy can be improved down to 200 fsRMS jitter, which together with the 300 ?V noise floor and 14 bits of resolution ensures the highest signal fidelity for the measured signals.