The N2100A implements a coherent patented vector under-sampling which combines the benefits and measurement capabilities of a real time scope with the bandwidth of a sampling scope. This PXI instrument uniquely combines the functionality of several traditional instruments in a single PXI module. The N2100A performs accurate eye diagram analysis to characterize the quality of transmitters from 50 Mb/s to 4.25 Gb/s.

Features

- Eye diagram, mask and jitter testing in a single instrument
- Cost effective architecture
- High throughput measurement engine
- Small form-factor 3 slot PXI card allowing multiple instruments to be deployed in a single chassis
- Ideal for manufacturing environments
- Wide optical bandwidth coverage from 780 nm to 1620 nm
- Single ended electrical input- Bessel Thomson filters (In software and/or hardware)
- Integral clock recovery for measurements up to 3.0 Gb/s- External reference clock input (SMA)