Description:

This unit is a wide band differential active probe.

This unit features low noise, low input capacitance, high common mode rejection, and FET buffered inputs in the probe head.

User selectable attenuation and offset give the probe flexibility to measure a large range of signal amplitudes.

Plug on attenuator and AC coupling accessories further extend the application range.

Interconnect accessories included allow connection to surface mount and through hole components with minimal signal degradation.

This provides a convenient low cost method of creating device characterization test fixtures.