The SDA is the first fully integrated test system designed specifically for evaluating the physical layer characteristics of both optical and electrical serial data signals. The highest fidelity frontend in the industry coupled with LeCroy's X-Stream Technology provide the foundation for this powerful analysis system that not only conducts Pass/Fail measurements but also traces the fault to the actual bit causing the error.

Specifications

• 4 Channels
• 6 GHz Bandwidth
• 10 GS/s Single-shot Sample Rate in 4 Ch Mode, 20 GS/s in 2 Ch Mode
• Standard Memory: 4Mpt/Ch in 4 Ch Mode, 8Mpt/Ch in 2 Ch Mode
• Memory Expandable to 48Mpts/Ch Maximum in 2 Channel Mode (Optional)
• 75 ps Rise Time (typical)
• All-SiGe front end (75 ps rise time)
• 1 ps RMS jitter noise floor
• < 2.5ps RMS trigger jitter
• Color 10.4" flat-panel TFT-LCD with high resolution touch screen
• 10/100Base-T Ethernet
• Win2000 O/S