Refurbished Agilent 4145B
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Refurbished
SEMICONDUCTOR PARAMETER ANALYZER Fully automatic, high-speed DC characterization of semiconductor devices. Sourcing and measurement 50 fA to 100 mA and 1 mV to 100 V. Up to 1140 measurement and display points for precise measurement and analysis. Flexible graphic analysis for quick parameter extraction. Built-in 3 1/2-inch disk drive for storage of 240 user programs or 105 measurement results. HP-IB. Options
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Agilent 4145B datasheet & specifications